Japan Aerospace Exploration Agency (JAXA)
Japan Aerospace Exploration Agency (JAXA)
Japan Aerospace Exploration Agency (JAXA)
High-Reliability Engineering & Components Corporation (HIREC)
Japan Aerospace Exploration Agency (JAXA)
Japan Aerospace Exploration Agency (JAXA)
出版者
宇宙航空研究開発機構(JAXA)
出版者（英）
Japan Aerospace Exploration Agency (JAXA)
雑誌名
宇宙航空研究開発機構特別資料
雑誌名(英)
JAXA Special Publication
巻
JAXA-SP-12-008E
ページ
127 - 130
発行年
2013-03-29
抄録（英）
This paper describes the evaluation result of the SEE sensitivity of 90nm DICE based flip-flops. Considering our past experimental results, modified DICE circuits were designed in order to minimize the charge sharing effect. The pulsed-laser SEE testing methodology was effectively utilized to identify the location of SEE sensitive areas. The comparison with the heavy ion irradiation test result were also discussed.
内容記述
形態: カラー図版あり
内容記述（英）
Physical characteristics: Original contains color illustrations
Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology
61889027.pdf
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