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Experimentally derived resistivity for dielectric samples from the CRRES Internal Discharge Monitor
https://jaxa.repo.nii.ac.jp/records/6332
https://jaxa.repo.nii.ac.jp/records/63328533cd9d-dcc4-4147-ba72-156f2f01a07e
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
49206017.pdf (1.3 MB)
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| Item type | 会議発表論文 / Conference Paper(1) | |||||||||||
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| 公開日 | 2015-03-26 | |||||||||||
| タイトル | ||||||||||||
| タイトル | Experimentally derived resistivity for dielectric samples from the CRRES Internal Discharge Monitor | |||||||||||
| 言語 | en | |||||||||||
| 言語 | ||||||||||||
| 言語 | eng | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | 宇宙機帯電 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 航空宇宙環境 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 誘電体 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 抵抗率 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 暗電流 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 電場 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 荷電粒子 | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | 分極 | |||||||||||
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| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | spacecraft charging | |||||||||||
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| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | aerospace environment | |||||||||||
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| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | dielectric | |||||||||||
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| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | resistivity | |||||||||||
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| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | dark current | |||||||||||
| キーワード | ||||||||||||
| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | electric field | |||||||||||
| キーワード | ||||||||||||
| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | charged particle | |||||||||||
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| 言語 | en | |||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | polarization | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| 著者 |
Green, Nelson W.
× Green, Nelson W.
× Frederickson, A. Robb
× Dennison, J. R.
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| 著者所属 | ||||||||||||
| California Institute of Technology Jet Propulsion Laboratory | ||||||||||||
| 著者所属 | ||||||||||||
| California Institute of Technology Jet Propulsion Laboratory | ||||||||||||
| 著者所属 | ||||||||||||
| Utah State University Physics Department | ||||||||||||
| 著者所属（英） | ||||||||||||
| en | ||||||||||||
| California Institute of Technology Jet Propulsion Laboratory | ||||||||||||
| 著者所属（英） | ||||||||||||
| en | ||||||||||||
| California Institute of Technology Jet Propulsion Laboratory | ||||||||||||
| 著者所属（英） | ||||||||||||
| en | ||||||||||||
| Utah State University Physics Department | ||||||||||||
| 出版者 | ||||||||||||
| 出版者 | 宇宙航空研究開発機構 | |||||||||||
| 出版者（英） | ||||||||||||
| 出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||||||||
| 書誌情報 |
宇宙航空研究開発機構特別資料 en : JAXA Special Publication: 9th Spacecraft Charging Technology Conference 巻 JAXA-SP-05-001E, p. 132-138, 発行日 2005-08-01 |
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| 抄録（英） | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | Resistivity values were experimentally determined using charge storage methods for six samples remaining from the construction of the Internal Discharge Monitor (IDM) flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of four to five weeks each in a vacuum of approximately 5 x 10(exp -6) torr with an average temperature of approximately 25 C to simulate a space environment. Samples tested included FR4, PTFE, and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit board material was found to have a dark current resistivity of approximately 1 x 10(exp 18) Ohm-cm and a moderately high polarization current. Fiber filled PTFE exhibited little polarization current and a dark current resistivity of approximately 3 x 10(exp 20) Ohm-cm. Alumina had a measured dark current resistivity of approximately 3 x 10(exp 17) Ohm-cm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard ASTM test methods. The one minute wait time suggested for the standard ASTM tests is much shorter than the measured polarization current decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged particles transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark current components from long duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport. | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | ISSN | |||||||||||
| 収録物識別子 | 1349-113X | |||||||||||
| 書誌レコードID | ||||||||||||
| 収録物識別子タイプ | NCID | |||||||||||
| 収録物識別子 | AA11984031 | |||||||||||
| 資料番号 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 資料番号: AA0049206017 | |||||||||||
| レポート番号 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | レポート番号: JAXA-SP-05-001E | |||||||||||
