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Resistance-Based Modeling for Soft Errors in SOI SRAMs Caused by Radiation-Induced Potential Perturbation Under the BOX
https://jaxa.repo.nii.ac.jp/records/29948
https://jaxa.repo.nii.ac.jp/records/29948740c91ef-b2f1-4642-9fdf-ce088d2c7faf
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2019-01-30 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Resistance-Based Modeling for Soft Errors in SOI SRAMs Caused by Radiation-Induced Potential Perturbation Under the BOX | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Soft error | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | radiation effect | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | silicon-on-insulator. | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Chung, Chin-Han
× Chung, Chin-Han× 小林, 大輔× 廣瀬, 和之× Chung, Chin-Han× Kobayashi, Daisuke× Hirose, Kazuyuki |
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著者所属 | ||||||
東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) | ||||||
著者所属 | ||||||
東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) | ||||||
著者所属 | ||||||
東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Electrical Engineering and Informative System, Graduate School of Engineering, University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Electrical Engineering and Informative System, Graduate School of Engineering, University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Electrical Engineering and Informative System, Graduate School of Engineering, University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) | ||||||
出版者(英) | ||||||
出版者 | Institute of Electrical and Electronics Engineers, Inc. | |||||
書誌情報 |
en : IEEE Transactions on Device and materials Reliability 巻 18, 号 4, p. 574-582, 発行日 2018-12 |
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内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Accepted: 2018-09-24 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1530-4388 | |||||
ISSNONLINE | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1558-2574 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11569084 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TDMR.2018.2873220 | |||||
関連名称 | info:doi/10.1109/TDMR.2018.2873220 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: SA1180171000 |