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State-of-the-Art Study on Mitigation Techniques of Single Event Effects in Terrestrial Applications
https://jaxa.repo.nii.ac.jp/records/4326
https://jaxa.repo.nii.ac.jp/records/4326b0a5c623-4074-43be-a6b8-dd31a295c06d
名前 / ファイル | ライセンス | アクション |
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61889032.pdf (556.6 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | State-of-the-Art Study on Mitigation Techniques of Single Event Effects in Terrestrial Applications | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | terrestrial radiation | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | fault | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | soft-error | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | failure | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | network | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | stack layer | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | mitigation | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | DOUB | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | LABIR | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | TMR | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | MCBI | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | bipolar action | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
Ibe, Eishi
× Ibe, Eishi× Shimbo, Kenichi× Toba, Tadanobu× Taniguchi, Hitoshi× Uezono, Takumi× Nishii, Koji× Taniguchi, Yoshio× Ibe, Eishi× Shimbo, Kenichi× Toba, Tadanobu× Taniguchi, Hitoshi× Uezono, Takumi× Nishii, Koji× Taniguchi, Yoshio |
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著者所属 | ||||||
日立製作所横浜研究所 | ||||||
著者所属 | ||||||
日立製作所横浜研究所 | ||||||
著者所属 | ||||||
日立製作所横浜研究所 | ||||||
著者所属 | ||||||
日立製作所横浜研究所 | ||||||
著者所属 | ||||||
日立製作所横浜研究所 | ||||||
著者所属 | ||||||
日立製作所通信ネットワーク事業部 | ||||||
著者所属 | ||||||
日立製作所 | ||||||
著者所属(英) | ||||||
en | ||||||
Yokohama Research Laboratory, Hitachi, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Yokohama Research Laboratory, Hitachi, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Yokohama Research Laboratory, Hitachi, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Yokohama Research Laboratory, Hitachi, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Yokohama Research Laboratory, Hitachi, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Telecommunication & Network System Division, Hitachi, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Corporate Quality Assurance Division, Hitachi, Ltd. | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構(JAXA) | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料 en : JAXA Special Publication 巻 JAXA-SP-12-008E, p. 148-154, 発行日 2013-03-29 |
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抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Abstract-As semiconductor device scaling is on-going far below 100nm design rule, terrestrial neutron-induced soft-error typically in CMOS devices is predicted to be worsen furthermore. Moreover, novel failure modes that may be more serious than those in memory soft-error are recently being reported. Therefore, necessity of implementing mitigation techniques is rapidly growing at the design phase, together with development of advanced detection and quantification techniques. The most advanced such techniques are reviewed and discussed. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: カラー図版あり | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains color illustrations | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0061889032 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-12-008E |